Friday 28 October 2016

Package Drop Test - Application 162

Application Summary
Drop testing packaging is a novel way of testing the viability of various packaging processes to ensure that packaged products arrive at their destination safely. To accomplish this, a system is designed to drop packages from varying heights onto a platform that rests upon load cells placed beneath the platform. The load cells output the force of the impact of the packaging. In addition, by making the platform removable, different platforms can be constructed to test different drops, such as dropping down stairs.

Products in Use
FUTEK’s Pancake Load Cells (LCF Series) coupled with USB530 High Speed, USB Data Acquisition Kit. View Product Details

How it Works
  1. Four LCF series pancake load cells are mount on the four corners of the drop test machine base. The test platform is then bolted over the four load cells.
  2. When a package is dropped, the load cells in each corner measure and send load data to the USB530 data acquisition unit.
  3. The data collected is displayed, logged, and graphed via SENSIT on a PC.
  4. By changing out the test platform, different drop scenarios can be simulated and recorded for study and compliance with testing standards such as ASTM D5276 and ISTA 1a, 2a, and 3a.
If you like further information on any of the Futek's Applications and reside in Australia or New Zealand, please contact Metromatics on +61 7 3868 4255 or sales@metromatics.com.au  
For outside this area, contact FUTEK directly on +949 465 0900


No comments:

Post a Comment